1992, ISBN: 9780849311789
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2000, ISBN: 9780849311789
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Editor: Moyne, James, Editor: del Castillo, Enrique, Editor: Hurwitz, Arnon M. Contributor: Khan, B. Karumullah, Contributor: Chen, Argon, Contributor: Guo, Ruey-Shan, Contributor: Moyne,… Mehr…
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Hardback, [PU: Taylor & Francis Inc], Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits o… Mehr…
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2000, ISBN: 0849311780
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1992, ISBN: 9780849311789
North-Holland, 1992-07-01. Hardcover. Very Good. 1992 first edition North-Holland / Elsevier (Amsterdam, The Netherlands), 6 1/4 x 9 inches tall blue cloth hardcover, no dust jacket (as… Mehr…
2000, ISBN: 9780849311789
Gebundene Ausgabe
Editor: Moyne, James, Editor: del Castillo, Enrique, Editor: Hurwitz, Arnon M. Contributor: Khan, B. Karumullah, Contributor: Chen, Argon, Contributor: Guo, Ruey-Shan, Contributor: Moyne,… Mehr…
2000
ISBN: 9780849311789
Hard cover, D'occasion, très bon état, Very Good condition. A copy that may have a few cosmetic defects. May also contain light spine creasing or a few markings such as an owner's name, s… Mehr…
ISBN: 9780849311789
Hardback, [PU: Taylor & Francis Inc], Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits o… Mehr…
2000, ISBN: 0849311780
[EAN: 9780849311789], D'occasion, très bon état, [SC: 9.12], [PU: Taylor & Francis Group], Used book that is in excellent condition. May show signs of wear or have minor defects., Books
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Detailangaben zum Buch - Run-to-Run Control in Semiconductor Manufacturing
EAN (ISBN-13): 9780849311789
ISBN (ISBN-10): 0849311780
Gebundene Ausgabe
Erscheinungsjahr: 2000
Herausgeber: CRC Press
368 Seiten
Gewicht: 0,617 kg
Sprache: eng/Englisch
Buch in der Datenbank seit 2007-12-04T21:37:00+01:00 (Vienna)
Detailseite zuletzt geändert am 2023-08-11T14:39:26+02:00 (Vienna)
ISBN/EAN: 9780849311789
ISBN - alternative Schreibweisen:
0-8493-1178-0, 978-0-8493-1178-9
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: hurwitz, enrique del castillo, moyne, arnon
Titel des Buches: run, semiconductor manufacturing
Daten vom Verlag:
Autor/in: A. M. Hurwitz; James Moyne; Duane Boning; Enrique DelCastillo
Titel: Run-to-Run Control in Semiconductor Manufacturing
Verlag: CRC Press
141,00 € (DE)
141,00 CHF (CH)
Not available (reason unspecified)
00; GB
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Neuestes ähnliches Buch:
9781420040661 Run-to-Run Control in Semiconductor Manufacturing (J.K. Petersen)
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