ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
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Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - gebunden oder broschiert
2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… Mehr…
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ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
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Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - Erstausgabe
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… Mehr…
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Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - Erstausgabe
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … Mehr…
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Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters - neues Buch
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
Garg, Rajesh:
Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - gebunden oder broschiert2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… Mehr…
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - Erstausgabe
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… Mehr…
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - Erstausgabe
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … Mehr…
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Detailangaben zum Buch - Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters
EAN (ISBN-13): 9781441909305
ISBN (ISBN-10): 1441909303
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Rajesh Garg
212 Seiten
Gewicht: 0,501 kg
Sprache: eng/Englisch
Buch in der Datenbank seit 2009-12-07T21:28:53+01:00 (Vienna)
Detailseite zuletzt geändert am 2024-02-11T22:40:49+01:00 (Vienna)
ISBN/EAN: 9781441909305
ISBN - alternative Schreibweisen:
1-4419-0930-3, 978-1-4419-0930-5
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: sunil, garg
Titel des Buches: circuits, error design, vlsi, design and analysis, circuit analysis, garg, process design
Daten vom Verlag:
Autor/in: Rajesh Garg
Titel: Analysis and Design of Resilient VLSI Circuits - Mitigating Soft Errors and Process Variations
Verlag: Springer; Springer US
212 Seiten
Erscheinungsjahr: 2009-11-16
New York; NY; US
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXII, 212 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Crosstalk; EDA; Power Supply Variation; Radiation Effects; Resilient VLSI Design; Soft Errors; VLSI; VLSI Design; algorithms; circuit design; design automation; electronic design automation; modeling; simulation; stability; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers Includes supplementary material: sn.pub/extras
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