2010, ISBN: 3642087183
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ISBN: 9783642087189
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… Mehr…
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2010, ISBN: 3642087183
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Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… Mehr…
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2010, ISBN: 9783642087189
Taschenbuch
Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010
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2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg], Druck auf Anfrage Neuware - Printed after ordering - Transmission electron microscopy (TEM) is now recognized as a crucial… Mehr…
2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg Okt 2010], This item is printed on demand - it takes 3-4 days longer - Neuware -Transmission electron microscopy (TEM) is no… Mehr…
ISBN: 9783642087189
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… Mehr…
2010, ISBN: 3642087183
Gebundene Ausgabe
Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… Mehr…
2010, ISBN: 9783642087189
Taschenbuch
Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010
Bibliographische Daten des bestpassenden Buches
| Autor: | |
| Titel: | |
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Detailangaben zum Buch - Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor
EAN (ISBN-13): 9783642087189
ISBN (ISBN-10): 3642087183
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2010
Herausgeber: Springer Berlin Heidelberg Core >1 >T
328 Seiten
Gewicht: 0,497 kg
Sprache: eng/Englisch
Buch in der Datenbank seit 2011-02-05T11:39:57+01:00 (Vienna)
Detailseite zuletzt geändert am 2024-01-11T21:28:33+01:00 (Vienna)
ISBN/EAN: 3642087183
ISBN - alternative Schreibweisen:
3-642-08718-3, 978-3-642-08718-9
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: zhang xiao, zhang feng
Titel des Buches: progress materials science, transmission, electron microscopy, surface science series
Daten vom Verlag:
Autor/in: Xiao-Feng Zhang; Ze Zhang
Titel: Springer Series in Surface Sciences; Progress in Transmission Electron Microscopy 2 - Applications in Materials Science
Verlag: Springer; Springer Berlin
307 Seiten
Erscheinungsjahr: 2010-10-19
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XIV, 307 p.
BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Nanotechnology; Characterization and Analytical Technique; Wissenschaftliche Standards, Normung usw. Nanotechnologie; Werkstoffprüfung; BB
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.Reviews the modern developments that have made transmission electron microscopy indispensible for materials research Includes supplementary material: sn.pub/extras
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