2016, ISBN: 9783319490540
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2016, ISBN: 3319490540
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2016, ISBN: 9783319490540
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[EAN: 9783319490540], Libro nuevo, [SC: 17.5], [PU: Springer International Publishing], INTELLIGENZ KÜNSTLICHE KI - AI COMPLEXNETWORKS MACHINELEARNING OPTIMIZATION SEMANTICSEGMENTATION VI… Mehr…
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Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2016, Mda, Mexico, November 29 - December 2, 2016, Proceedings - Taschenbuch
2016, ISBN: 9783319490540
Springer-Verlag New York Inc, 2016. Paperback. New. 604 pages. 9.25x6.10x1.37 inches., Springer-Verlag New York Inc, 2016, 6
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2016, ISBN: 9783319490540
Taschenbuch
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings, Buch, Softcover, 1st ed. 2016, This book constitutes the proceedings of the Jo… Mehr…
2016, ISBN: 3319490540
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International W… Mehr…
2016
ISBN: 9783319490540
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International W… Mehr…
2016, ISBN: 3319490540
[EAN: 9783319490540], Libro nuevo, [SC: 17.5], [PU: Springer International Publishing], INTELLIGENZ KÜNSTLICHE KI - AI COMPLEXNETWORKS MACHINELEARNING OPTIMIZATION SEMANTICSEGMENTATION VI… Mehr…
Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2016, Mda, Mexico, November 29 - December 2, 2016, Proceedings - Taschenbuch
2016, ISBN: 9783319490540
Springer-Verlag New York Inc, 2016. Paperback. New. 604 pages. 9.25x6.10x1.37 inches., Springer-Verlag New York Inc, 2016, 6
Bibliographische Daten des bestpassenden Buches
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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
Detailangaben zum Buch - Structural, Syntactic, and Statistical Pattern Recognition
EAN (ISBN-13): 9783319490540
ISBN (ISBN-10): 3319490540
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2016
Herausgeber: Springer International Publishing
Buch in der Datenbank seit 2017-01-05T00:01:08+01:00 (Vienna)
Detailseite zuletzt geändert am 2023-11-16T21:08:24+01:00 (Vienna)
ISBN/EAN: 9783319490540
ISBN - alternative Schreibweisen:
3-319-49054-0, 978-3-319-49054-0
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: marc escola, rich fran kelly, richard marc, marc antonio, anton wilson, loog, marco battista, francis kelly, antoni richard, biggio, francisco escolano
Titel des Buches: merida, structural pattern recognition, mexico
Daten vom Verlag:
Autor/in: Antonio Robles-Kelly; Marco Loog; Battista Biggio; Francisco Escolano; Richard Wilson
Titel: Lecture Notes in Computer Science; Image Processing, Computer Vision, Pattern Recognition, and Graphics; Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Verlag: Springer; Springer International Publishing
588 Seiten
Erscheinungsjahr: 2016-11-05
Cham; CH
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XIII, 588 p. 167 illus.
BC; Hardcover, Softcover / Informatik, EDV/Informatik; Künstliche Intelligenz; Verstehen; complex networks; machine learning; optimization; semantic segmentation; visualization; artificial intelligence; biometrics; database query processing and optimization; graph mining; graph theory and discrete mathematics; image classification; infromation storage and retrieval; information systems; multi-label classification; nonlinear embedding; object tracking; probabilistic inference problems; programming techniques; semi-supervised learning; structural SV; Artificial Intelligence; Automated Pattern Recognition; Computer and Information Systems Applications; Database Management; Algorithms; Data Mining and Knowledge Discovery; Mustererkennung; Angewandte Informatik; Datenbanken; Algorithmen und Datenstrukturen; Data Mining; Wissensbasierte Systeme, Expertensysteme; EA
Dimensionality reduction.- Manifold learning and embedding methods.-Dissimilarity representations.- Graph-theoretic methods.- Model selection, classification and clustering.- Semi and fully supervised learning methods.- Shape analysis.- Spatio-temporal pattern recognition.- Structural matching.- Text and document analysis.Includes supplementary material: sn.pub/extras
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