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Structural, Syntactic, and Statistical Pattern Recognition - Edwin R. Hancock
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Edwin R. Hancock:
Structural, Syntactic, and Statistical Pattern Recognition - Taschenbuch

2010, ISBN: 3642149790

ID: 3727731613

[EAN: 9783642149795], Neubuch, [PU: Springer-Verlag Gmbh Sep 2010], ALGORITHMUS; DATA MINING (EDV); DATENVERARBEITUNG / INFORMATIONSMANAGEMENT; INFORMATIONSSYSTEM; INTELLIGENZ KÜNSTLICHE INTELLIGENZ; KI; - AI; AI ( ); MATHEMATIK, Neuware - This volume in the Springer Lecture Notes in Computer Science (LNCS) series contains the papers presented at the S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly. S+SSPR 2010 was organized by TC1 and TC2, Technical Committees of the International Association for Pattern Recognition(IAPR), andheld inCesme, Izmir, whichis a seaside resort on the Aegean coast of Turkey. The conference took place during August 18-20, 2010, only a few days before the 20th International Conference on Pattern Recognition (ICPR) which was held in Istanbul. The aim of the series of workshops is to create an international forum for the presentation of the latest results and exchange of ideas between researchers in the elds of statistical and structural pattern recognition. SPR 2010 and SSPR 2010 received a total of 99 paper submissions from many di erent countries around the world, giving it a truly international perspective, as has been the case for previous S+SSPR workshops. This volume contains 70 accepted papers, 39 for oral and 31 for poster presentation. In addition to par- lel oral sessions for SPR and SSPR, there were two joint oral sessions of interest to both SPR and SSPR communities. Furthermore, to enhance the workshop experience, there were two joint panel sessions on 'Structural Learning' and 'Clustering,' in which short author presentations were followed by discussion. Another innovation this year was the lming of the proceedings by Videol- tures. 758 pp. Englisch

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Structural, Syntactic, and Statistical Pattern Recognition - Herausgegeben von Hancock, Edwin R. Wilson, Richard C Windeatt, Terry Ulusoy, Ilkay Escolano, Francisco
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Herausgegeben von Hancock, Edwin R. Wilson, Richard C Windeatt, Terry Ulusoy, Ilkay Escolano, Francisco:
Structural, Syntactic, and Statistical Pattern Recognition - Taschenbuch

2010, ISBN: 9783642149795

[ED: Softcover], [PU: Springer, Berlin], This volume in the Springer Lecture Notes in Computer Science (LNCS) series contains the papers presented at the S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly. S+SSPR 2010 was organized by TC1 and TC2, Technical Committees of the International Association for Pattern Recognition(IAPR), andheld inCesme, Izmir, whichis a seaside resort on the Aegean coast of Turkey. The conference took place during August 18-20, 2010, only a few days before the 20th International Conference on Pattern Recognition (ICPR) which was held in Istanbul. The aim of the series of workshops is to create an international forum for the presentation of the latest results and exchange of ideas between researchers in the ?elds of statistical and structural pattern recognition. SPR 2010 and SSPR 2010 received a total of 99 paper submissions from many di?erent countries around the world, giving it a truly international perspective, as has been the case for previous S+SSPR workshops. This volume contains 70 accepted papers, 39 for oral and 31 for poster presentation. In addition to par- lel oral sessions for SPR and SSPR, there were two joint oral sessions of interest to both SPR and SSPR communities. Furthermore, to enhance the workshop experience, there were two joint panel sessions on "Structural Learning" and "Clustering," in which short author presentations were followed by discussion. Another innovation this year was the ?lming of the proceedings by Videol- tures. 2010. xv, 758 S. 246 SW-Abb. 237 mm Sofort lieferbar, DE, [SC: 0.00], Neuware, gewerbliches Angebot, offene Rechnung (Vorkasse vorbehalten)

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Structural, Syntactic, and Statistical Pattern Recognition
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Structural, Syntactic, and Statistical Pattern Recognition - neues Buch

2010, ISBN: 9783642149795

ID: 91582f2683f29a7df5b677c8436fac97

This volume in the Springer Lecture Notes in Computer Science (LNCS) series contains the papers presented at the S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly. S+SSPR 2010 was organized by TC1 and TC2, Technical Committees of the International Association for Pattern Recognition(IAPR), andheld inCesme, Izmir, whichis a seaside resort on the Aegean coast of Turkey. The conference took place during August 18-20, 2010, only a few days before the 20th International Conference on Pattern Recognition (ICPR) which was held in Istanbul. The aim of the series of workshops is to create an international forum for the presentation of the latest results and exchange of ideas between researchers in the ?elds of statistical and structural pattern recognition. SPR 2010 and SSPR 2010 received a total of 99 paper submissions from many di?erent countries around the world, giving it a truly international perspective, as has been the case for previous S+SSPR workshops. This volume contains 70 accepted papers, 39 for oral and 31 for poster presentation. In addition to par- lel oral sessions for SPR and SSPR, there were two joint oral sessions of interest to both SPR and SSPR communities. Furthermore, to enhance the workshop experience, there were two joint panel sessions on "Structural Learning" and "Clustering," in which short author presentations were followed by discussion. Another innovation this year was the ?lming of the proceedings by Videol- tures. Bücher / Naturwissenschaften, Medizin, Informatik & Technik / Informatik & EDV / Anwendungs-Software, [PU: Springer, Berlin/Heidelberg/New York, NY]

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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings - Hancock, Edwin R. (Herausgeber); Wilson, Richard C. (Herausgeber); Windeatt, Terry (Herausgeber); Ulusoy, Ilkay (Herausgeber); Escolano, Francisco (Herausgeber)
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Hancock, Edwin R. (Herausgeber); Wilson, Richard C. (Herausgeber); Windeatt, Terry (Herausgeber); Ulusoy, Ilkay (Herausgeber); Escolano, Francisco (Herausgeber):
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings - neues Buch

2010, ISBN: 3642149790

ID: A10319628

Edition Kartoniert / Broschiert Algorithmus, Data Mining (EDV), Datenverarbeitung / Informationsmanagement, Informationssystem, Intelligenz / Künstliche Intelligenz, KI, Künstliche Intelligenz - AI, AI ( Künstliche Intelligenz ), Mathematik, Internetrecherche, Suchmaschinen, Algorithmen und Datenstrukturen, Datenbankprogrammierung, Data Warehousing, Informationsrückgewinnung, Information Retrieval, Künstliche Intelligenz, Wartung und Reparaturen, IT, Data Mining, Mathematik und Naturwissenschaften, mit Schutzumschlag neu, [PU:Springer-Verlag GmbH; Springer Berlin]

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ID: 868663001

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Details zum Buch
Structural, Syntactic, and Statistical Pattern Recognition

This volume constitutes the refereed proceedings of the Joint IAPR International Workshop, SSPR & SPR 2010, held in Cesme, Izmir, Turkey, in August 2010.

Detailangaben zum Buch - Structural, Syntactic, and Statistical Pattern Recognition


EAN (ISBN-13): 9783642149795
ISBN (ISBN-10): 3642149790
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2010
Herausgeber: Springer-Verlag GmbH
758 Seiten
Gewicht: 1,092 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 10.04.2009 09:52:31
Buch zuletzt gefunden am 23.04.2018 10:13:25
ISBN/EAN: 9783642149795

ISBN - alternative Schreibweisen:
3-642-14979-0, 978-3-642-14979-5


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