ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
Orellfuessli.ch Nr. A1031608643. Versandkosten:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.75) Details... |
2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
Thalia.de Nr. 33784366. Versandkosten:, Sofort per Download lieferbar, DE. (EUR 0.00) Details... |
ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
Springer.com new in stock. Versandkosten:zzgl. Versandkosten. (EUR 0.00) Details... |
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013
lehmanns.de Versandkosten:Download sofort lieferbar. (EUR 0.00) Details... |
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013
lehmanns.de Versandkosten:Download sofort lieferbar. (EUR 0.00) Details... |
ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
Brent Fultz#James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013
Bibliographische Daten des bestpassenden Buches
Autor: | |
Titel: | |
ISBN-Nummer: |
Detailangaben zum Buch - Transmission Electron Microscopy and Diffractometry of Materials
EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Erscheinungsjahr: 2012
Herausgeber: Springer Lehrbuch
761 Seiten
Sprache: eng/Englisch
Buch in der Datenbank seit 2012-11-07T08:35:01+01:00 (Vienna)
Detailseite zuletzt geändert am 2023-01-10T23:14:26+01:00 (Vienna)
ISBN/EAN: 9783642297618
ISBN - alternative Schreibweisen:
3-642-29761-7, 978-3-642-29761-8
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: james, howe, jam, brent, fultz
Titel des Buches: electron microscopy materials, material, electro, transmission
Weitere, andere Bücher, die diesem Buch sehr ähnlich sein könnten:
Neuestes ähnliches Buch:
9783540437642 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James)
- 9783540437642 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James)
- 9783540738855 Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises (Fultz, Brent, Howe, James)
- 9783540678410 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James M.)
- Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) by Brent Fultz James Howe(2012-10-14) (Brent Fultz;James M. Howe)
< zum Archiv...