Theoretical Concepts of X-Ray Nanoscale Analysis : Theory and Applications - gebunden oder broschiert
2013, ISBN: 3642381766
[EAN: 9783642381768], Neubuch, [SC: 12.02], [PU: Springer Berlin Heidelberg], X-RAYPOLARIZABILITY; X-RAYPOWDERDIFFRACTION; X-RAYREFLECTIVITYBOOK; X-RAYSPECTROSCOPY; X-RAYTHEORYEXPLAINED; … Mehr…
ZVAB.com AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)] NEW BOOK. Versandkosten: EUR 12.02 Details... |
2014, ISBN: 9783642381768
[ED: Hardcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The princi… Mehr…
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Theoretical Concepts of X-Ray Nanoscale Analysis / Theory and Applications / Andrei Benediktovich (u. a.) / Buch / Springer Series in Materials Science / HC runder Rücken kaschiert / XIII / Englisch - gebunden oder broschiert
2013, ISBN: 9783642381768
[ED: Gebunden], [PU: Springer-Verlag GmbH], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics … Mehr…
booklooker.de |
Theoretical Concepts of X-Ray Nanoscale Analysis | Theory and Applications | Andrei Benediktovich (u. a.) | Buch | Springer Series in Materials Science | HC runder Rücken kaschiert | XIII | Englisch - gebunden oder broschiert
2013, ISBN: 9783642381768
[ED: Gebunden], [PU: Springer-Verlag GmbH], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics … Mehr…
booklooker.de |
ISBN: 9783642381768
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-r… Mehr…
Springer.com Nr. 978-3-642-38176-8. Versandkosten:Worldwide free shipping, , zzgl. Versandkosten. (EUR 0.00) Details... |
Theoretical Concepts of X-Ray Nanoscale Analysis : Theory and Applications - gebunden oder broschiert
2013, ISBN: 3642381766
[EAN: 9783642381768], Neubuch, [SC: 12.02], [PU: Springer Berlin Heidelberg], X-RAYPOLARIZABILITY; X-RAYPOWDERDIFFRACTION; X-RAYREFLECTIVITYBOOK; X-RAYSPECTROSCOPY; X-RAYTHEORYEXPLAINED; … Mehr…
Benediktovitch, Andrei;Feranchuk, Ilya;Ulyanenkov, Alexander:
Theoretical Concepts of X-Ray Nanoscale Analysis - gebunden oder broschiert2014, ISBN: 9783642381768
[ED: Hardcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The princi… Mehr…
Theoretical Concepts of X-Ray Nanoscale Analysis / Theory and Applications / Andrei Benediktovich (u. a.) / Buch / Springer Series in Materials Science / HC runder Rücken kaschiert / XIII / Englisch - gebunden oder broschiert
2013
ISBN: 9783642381768
[ED: Gebunden], [PU: Springer-Verlag GmbH], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics … Mehr…
Theoretical Concepts of X-Ray Nanoscale Analysis | Theory and Applications | Andrei Benediktovich (u. a.) | Buch | Springer Series in Materials Science | HC runder Rücken kaschiert | XIII | Englisch - gebunden oder broschiert
2013, ISBN: 9783642381768
[ED: Gebunden], [PU: Springer-Verlag GmbH], This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics … Mehr…
ISBN: 9783642381768
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-r… Mehr…
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Detailangaben zum Buch - Theoretical Concepts of X-Ray Nanoscale Analysis by Andrei Benediktovich Hardcover | Indigo Chapters
EAN (ISBN-13): 9783642381768
ISBN (ISBN-10): 3642381766
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2013
Herausgeber: Andrei Benediktovich
Buch in der Datenbank seit 2014-03-26T08:56:57+01:00 (Vienna)
Detailseite zuletzt geändert am 2024-01-09T23:13:16+01:00 (Vienna)
ISBN/EAN: 9783642381768
ISBN - alternative Schreibweisen:
3-642-38176-6, 978-3-642-38176-8
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: ben alexander, widmann benedikt, ilya, benediktov, residual stress
Titel des Buches: analysis, anal, rays theory and experiment, ray
Daten vom Verlag:
Autor/in: Andrei Benediktovich; Ilya Feranchuk; Alexander Ulyanenkov
Titel: Springer Series in Materials Science; Theoretical Concepts of X-Ray Nanoscale Analysis - Theory and Applications
Verlag: Springer; Springer Berlin
318 Seiten
Erscheinungsjahr: 2013-09-18
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
149,79 € (DE)
153,99 € (AT)
165,50 CHF (CH)
POD
XIII, 318 p. 108 illus., 37 illus. in color.
BB; Hardcover, Softcover / Technik/Allgemeines, Lexika; Wissenschaftliche Standards, Normung usw. Verstehen; Ingenieurwissenschaften; X-ray polarizability; X-ray powder diffraction; X-ray reflectivity book; X-ray spectroscopy; X-ray theory explained; dynamical theory of diffraction; grazing-incidence diffraction; materials analysis; theory of X-ray diffraction in crystals; x-ray diffraction theory; Measurement Science and Instrumentation; Characterization and Analytical Technique; Theoretical, Mathematical and Computational Physics; Applied and Technical Physics; Spectroscopy; Werkstoffprüfung; Mathematische Physik; Angewandte Physik; Spektroskopie, Spektrochemie, Massenspektrometrie; EA; BC
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.Gives a state-of-the-art report of the understanding of X-ray scattering and diffraction Contains theoretical methods for a wide range of X-ray materials research Includes detailed explanations of theoretical models and approaches Includes supplementary material: sn.pub/extras
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