Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings) - gebunden oder broschiert
2000, ISBN: 0735400113
Hardcover, [EAN: 9780735400115], American Institute of Physics, American Institute of Physics, Book, [PU: American Institute of Physics], 2001-08-01, American Institute of Physics, 922354… Mehr…
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2001, ISBN: 9780735400115
American Institute of Physics, Gebundene Ausgabe, Auflage: 2001, 304 Seiten, Publiziert: 2001-08-01T00:00:01Z, Produktgruppe: Book, 1.37 kg, Astronomie, Naturwissenschaften & Technik, Kat… Mehr…
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2000, ISBN: 9780735400115
Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium, Ebis/t 2000, Upton, New York, 5-8 November 2000 Hardcover New Books, Amer Inst of Physics
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Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings) - gebunden oder broschiert
2000, ISBN: 9780735400115
American Inst. of Physics, 2001-08-02. Hardcover. Good., American Inst. of Physics, 2001-08-02
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2001, ISBN: 0735400113
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Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings) - gebunden oder broschiert
2000, ISBN: 0735400113
Hardcover, [EAN: 9780735400115], American Institute of Physics, American Institute of Physics, Book, [PU: American Institute of Physics], 2001-08-01, American Institute of Physics, 922354… Mehr…
2001, ISBN: 9780735400115
American Institute of Physics, Gebundene Ausgabe, Auflage: 2001, 304 Seiten, Publiziert: 2001-08-01T00:00:01Z, Produktgruppe: Book, 1.37 kg, Astronomie, Naturwissenschaften & Technik, Kat… Mehr…
Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium, Ebis/t 2000, Upton, New York, 5-8 November 2000 - neues Buch
2000
ISBN: 9780735400115
Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium, Ebis/t 2000, Upton, New York, 5-8 November 2000 Hardcover New Books, Amer Inst of Physics
Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings) - gebunden oder broschiert
2000, ISBN: 9780735400115
American Inst. of Physics, 2001-08-02. Hardcover. Good., American Inst. of Physics, 2001-08-02
2001, ISBN: 0735400113
[EAN: 9780735400115], Gebraucht, wie neu, [PU: American Institute of Physics], LIKE NEW
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Detailangaben zum Buch - Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings, Band 572)
EAN (ISBN-13): 9780735400115
ISBN (ISBN-10): 0735400113
Gebundene Ausgabe
Erscheinungsjahr: 2001
Herausgeber: Prelec, Krsto, American Institute of Physics
304 Seiten
Gewicht: 0,617 kg
Sprache: eng/Englisch
Buch in der Datenbank seit 2007-06-21T22:00:12+02:00 (Vienna)
Detailseite zuletzt geändert am 2022-01-04T01:10:00+01:00 (Vienna)
ISBN/EAN: 9780735400115
ISBN - alternative Schreibweisen:
0-7354-0011-3, 978-0-7354-0011-5
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: trap, ion sources, traps
Titel des Buches: new york 2000, november, electron and ion beam
Daten vom Verlag:
Autor/in: Krsto Prelec
Titel: AIP Conference Proceedings; Electron Beam Ion Sources and Traps and Their Applications - 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000
Verlag: AIP Press
304 Seiten
Erscheinungsjahr: 2001-08-01
Gewicht: 0,620 kg
Sprache: Englisch
187,20 € (DE)
192,45 € (AT)
251,00 CHF (CH)
No longer receiving updates
BB; GB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik; Verstehen; atomic physics; atomic accelerators; Atomphysik; electron ion beams; elektrische Ionenstrahlen; Beam instrumentation; Atomphysik; Ionenstrahl; Research
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