Peter Roquette: Applied Scanning Probe Methods III : Characterization - neues Buch
ISBN: 9783540269106
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging.The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate … Mehr…
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging.The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms.At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM.The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample.These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM.The MFM will image a single magnetic bit with features as small as 10nm.With the EFM one can monitor the charge of a single electron.Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments.At this point the sluice gates were opened and a multitude of different instruments appeared.There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface.However, the SEM can record 3D image and movies, features that are not available with the scanning probes.; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Springer Berlin Heidelberg<
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate… Mehr…
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes., Springer<
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Applied Scanning Probe Methods III : Characterization - neues Buch
ISBN: 9783540269106
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging.The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate … Mehr…
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging.The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms.At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM.The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample.These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM.The MFM will image a single magnetic bit with features as small as 10nm.With the EFM one can monitor the charge of a single electron.Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments.At this point the sluice gates were opened and a multitude of different instruments appeared.There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface.However, the SEM can record 3D image and movies, features that are not available with the scanning probes.; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Springer Berlin Heidelberg<
No. 9783540269106. Versandkosten:Instock, Despatched same working day before 3pm, zzgl. Versandkosten.
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate… Mehr…
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes., Springer<
Nr. 978-3-540-26910-6. Versandkosten:Worldwide free shipping, , DE. (EUR 0.00)
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Detailangaben zum Buch - Applied Scanning Probe Methods III
EAN (ISBN-13): 9783540269106 ISBN (ISBN-10): 354026910X Erscheinungsjahr: 2006 Herausgeber: Springer Berlin 378 Seiten Sprache: eng/Englisch
Buch in der Datenbank seit 2008-10-22T01:16:14+02:00 (Vienna) Detailseite zuletzt geändert am 2024-01-14T12:42:07+01:00 (Vienna) ISBN/EAN: 9783540269106
ISBN - alternative Schreibweisen: 3-540-26910-X, 978-3-540-26910-6 Alternative Schreibweisen und verwandte Suchbegriffe: Autor des Buches: harald fuchs, bhushan, barbara paul Titel des Buches: applied scanning probe methods
Daten vom Verlag:
Autor/in: Bharat Bhushan Titel: NanoScience and Technology; Applied Scanning Probe Methods III - Characterization Verlag: Springer; Springer Berlin 378 Seiten Erscheinungsjahr: 2006-04-28 Berlin; Heidelberg; DE Gedruckt / Hergestellt in Deutschland. Sprache: Englisch 154,00 € (DE)
EA; E107; eBook; Nonbooks, PBS / Technik/Sonstiges; Elektronik; Verstehen; AFM; Fulleren; Fullerene; STEM; ceramics; microscopy; nanoparticle; polymer; spectroscopy; C; Nanotechnology and Microengineering; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Chemistry and Materials Science; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB
Atomic Force Microscopy in Nanomedicine.- Scanning Probe Microscopy: From Living Cells to the Subatomic Range.- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces.- Probing Macromolecular Dynamics and the Influence of Finite Size Effects.- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum.- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures.- Scanning Probe Microscopy Applied to Ferroelectric Materials.- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy.- AFM Applications for Contact and Wear Simulation.- AFM Applications for Analysis of Fullerene-Like Nanoparticles.- Scanning Probe Methods in the Magnetic Tape Industry.
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